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This conference was organized to answer the need in Europe for more information on the proposed revision to the standard IEC 60, High Voltage Test Techniques. Concern has been caused by the greater emphasis now placed on comparative measurements which are felt by some to be over-elaborate or to lead to unnecessarily high specifications.;After an introduction to the standard, the areas it covers are discussed, and the reasons for and the objectives of the new revisions are explained. The papers under ""International standards breakdown trade barriers, or do they?"" include: a keynote speech on harmonization and the single market, the basis of the new IEC standards for HV measurements, IEC specifications - problems and proposals.;""Accreditation, do we know where we are going?"" covers: the need for accreditation of certification bodies, NAMAS and Western European calibration co-operation, the accreditation of and the impact of IEC 60 revisions on the accreditation of HV laboratories.;""Are traceable HV measurements really achievable?"" dealt with: components for HV reference measuring systems, HV impulse measurements, DSP for HV impulse measurements, capacitance and tan measurements, and traceable HV loss tangent and capacitance measurements on very large electrical cables.;Supplementary papers cover: traceability in HV measurements, traceability of calibration for a reference measuring system for impulse measurements, how to calbrate HV impulse measuring systems, and IEC 60 and the assessment of linearity of an impulse divider. Exhibitor details and a delegates list are also provided. Postage extra.